MOSRG-1M40F
MOSRG-1M40F(RG Tester)
Basic function
Resistance and capacitance measurement - It can measure capacity of MOSFET RG.
SPCIFICATION
| Test item | Measured name | Measurement | Source name | Source | ||||
| Unit | Range | Resolution | Unit | Range | Resolution | |||
| RG | RG | Ω | 0.2~100 | ±0.2 | Fix frequency | Mhz | 1 | 1%±0.002 |
| CG | F | 10p~0.1u | 2%±5p | Mhz | 0.1 | ±1% | ||
| CISS | F | 10p~0.1u | 2%±5p | Level | Vrms | 0.1~1 | ±5%±0.02V | |
| BIAS Voltage | V | 0.0~40.0 | ±0.1 | |||||
| Conta | CONTA-G | Ω | 0.000~10.000 | ±3%±2cont | Conta I | A | 0.1 | ±1%±2cont |
| CONTA-D | Ω | 0.000~10.000 | ±3%±2cont | |||||
| CONTA-S | Ω | 0.000~10.000 | ±3%±2cont | |||||
Description of test regulation
Rg from:[MIL750 3402.1]
| Purpose | The purpose of this test is to determine the Gate Equivalent Series Resistance (ESR) of MOSFET devices. This test method provides a mean to ensure switching consistency of power MOSFET. ESR combined with gate charge measurements provide an alternative to high-current high-speed measurements where device fast switching characteristics are over-masked by test circuit stray elements. |
| Guide line | This method describes 2 test conditions. GateESR of MOSFET can be confirmed by this 2 conditions. Please see below description: Condition A: Use LCR meter to make sure GateESR. (Weimin adopts this one) Condition B: To make sure GateESR by manual. The apparatus required for condition A shall include the following, configured as shown on figure as applicable to the specified test procedure: a.Test circuit of GateESR 。 (1) Drain and source open mode test circuit(See load OC on figure)。 (2)Drain and source short mode test circuit(See load SC on figure)。 (3)Test circuit of Ciss(See load CC on figure)。 b.LCR meter. LCR Meter capable to supply the sine wave signal with magnitude up to 1 Volt and frequency of MHz (1MHZ typical)。 Note: Summary of condition A:The following conditions & limit shall be specified in detail specification for Condition A: a. Test frequency (in MHz), typical 1MHz。 b. Gate ESR, as RS from LCR meter (in Ohms)。 c. Effective gate capacitance, as CS from LCR meter (pico-Farad), optional 。 d. Load test circuit: (1) OC:Drain to source open-circuit.[optional] (2) SC:Drain to source short circuit.[optional] (3) CC:Ciss circuit。[disable] |





