SK-732
击穿氧化层一般电性二极体测试机
测试规格
| 测试 项目 |
量测 规格 |
输出 项目 |
輸出規格 | 备注 |
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| 单位 |
范围 |
精度 |
重复性 |
单位 |
范围 |
精度 |
输出时间 |
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| VF1 | V | 0.001~4.000 | ±0.5%±0.002 | ±0.002 | IF1 | A | 0.0001~0.0099 | ±0.5%+0.0002 | 0.3~9.9ms | |
| 0.0100~0.0400 | ±0.5%+0.0002 | 0.3~9.9ms | ||||||||
| 0.041~0.400 | ±0.5%+0.002 | 0.3~9.9ms | ||||||||
| 0.401~4.000 | ±0.5%+0.002 | 0.3~9.9ms | ||||||||
| 4.001~25.00 | ±0.5%+0.02 | 0.3~9.9ms | 註1 | |||||||
| VZ1 | V | 1.000~16.000 | ±0.5%+0.002 | ±0.002 | IZ1 | mA | .0050~.1000 | ±0.5%+0.0002 | 1~200ms | MAX 2000V |
| 16.01~160.00 | ±0.5%+0.02 | ±0.02 | 0.101~1.000 | ±0.5%+0.002 | 1~200ms | MAX 2000V | ||||
| 160.1~400.0 | ±0.5%+0.2 | ±0.2 | 1.01~10.00 | ±0.5%+0.02 | 1~200ms | MAX 400V | ||||
| 401~2000 | ±0.5%+2 | ±2 | 10.1~100 | ±0.5%+0.2 | 1~200ms | MAX 80V | ||||
| VZ2 | V | 1.000~16.000 | ±0.5%+0.002 | ±0.002 | IZ2 | mA | .0050~.1000 | ±0.5%+0.0002 | 1~200ms | MAX 2000V |
| 16.01~160.00 | ±0.5%+0.02 | ±0.02 | 0.101~1.000 | ±0.5%+0.002 | 1~200ms | MAX 2000V | ||||
| 160.1~400.0 | ±0.5%+0.2 | ±0.2 | 1.01~10.00 | ±0.5%+0.02 | 1~200ms | MAX 400V | ||||
| 401~2000 | ±0.5%+2 | ±2 | 10.1~100 | ±0.5%+0.2 | 1~200ms | MAX 80V | ||||
| VZ3 | V | 1.000~16.000 | ±0.5%+0.002 | ±0.002 | IZ3 | mA | .0050~.1000 | ±0.5%+0.0002 | 1~200ms | MAX 2000V |
| 16.01~160.00 | ±0.5%+0.02 | ±0.02 | 0.101~1.000 | ±0.5%+0.002 | 1~200ms | MAX 2000V | ||||
| 160.1~400.0 | ±0.5%+0.2 | ±0.2 | 1.01~10.00 | ±0.5%+0.02 | 1~200ms | MAX 400V | ||||
| 401~2000 | ±0.5%+2 | ±2 | 10.1~100 | ±0.5%+0.2 | 1~200ms | MAX 80V | ||||
| DVZ | DVZ = / VZ2 - VZ1 / | |||||||||
| IR | uA | .0010~.9900 | ±3%+0.0002 | VR = %VZ1 | 1% ~ 99% | 10~200ms | ||||
| 0.990~9.900 | ±3%+0.002 | |||||||||
| 9.90~99.00 | ±3%+0.02 | |||||||||
| 99.0~990.0 | ±3%+0.2 | |||||||||
| 990~9900 | ±3%+2 | |||||||||
| IR1 | uA | .0010~.9900 | ±3%+0.0002 | VR1 | V | 1.000~16.000 | ±0.5%+0.002 | 10~200ms | ||
| 0.990~9.900 | ±3%+0.002 | 16.01~160.00 | ±0.5%+0.02 | 10~200ms | ||||||
| 9.90~99.00 | ±3%+0.02 | 160.1~400.0 | ±0.5%+0.2 | 10~200ms | ||||||
| 99.0~990.0 | ±3%+0.2 | 401~2000 | ±0.5%+2 | 10~200ms | ||||||
| 990~9900 | ±3%+2 | |||||||||
| IR2 | uA | .0010~.9900 | ±3%+0.0002 | VR2 | V | 1.000~16.000 | ±0.5%+0.002 | 10~200ms | ||
| 0.990~9.900 | ±3%+0.002 | 16.01~160.00 | ±0.5%+0.02 | 10~200ms | ||||||
| 9.90~99.00 | ±3%+0.02 | 160.1~400.0 | ±0.5%+0.2 | 10~200ms | ||||||
| 99.0~990.0 | ±3%+0.2 | 401~2000 | ±0.5%+2 | 10~200ms | ||||||
| 990~9900 | ±3%+2 | |||||||||
| DIR | DIR = / IR1 - IR2 / | |||||||||
- 1.若IF1 >10A 输出时间MAX 1ms
- 2.单向与双向测试能力
- 3.RS232输出能力
- 4.自我校验功能
- 5.电源:AC 110V\220V可选
- 6.可透过通讯指令设定起始IZ电流,终止IZ电流,IZ步阶电流,将每点VZ值透过通讯传输至PC绘制VZ曲线。




